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arXiv 0707.0963quant-ph
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量子门的随机基准测试

Randomized Benchmarking of Quantum Gates

E. Knill, D. Leibfried, R. Reichle, J. Britton, R. B. Blakestad, J. D. Jost, C. Langer, R. Ozeri, S. Seidelin, D. J. Wineland

摘要:

可扩展量子计算的关键要求是基本量子门可以以足够低的误差实现。用于确定门实现的错误行为的一种方法是执行过程层析成像。然而,标准过程层析成像受到状态准备、测量和单量子位门中的误差的限制。它的缺点是量子位数的缩放效率低下,并且当门是由长序列组成时,它不能检测到不利的错误复合。另一个问题是由于可扩展量子计算的期望错误概率为0.0001或更低的量级的事实。实验证明如此低的误差是具有挑战性的。我们描述了一种随机基准测试方法,该方法在不依赖于准确的状态准备和测量的情况下产生计算相关误差的估计。由于它涉及随机选择的门的长序列,因此它还验证了在长计算中使用时错误行为是稳定的。我们对捕获的原子离子量子比特实施了随机基准测试,在特定实验中建立了每个随机pi/2脉冲的一个量子比特错误概率为0.00482(17)。我们希望通过简单的技术修改可以很容易地改善这种错误概率。

英文摘要:

A key requirement for scalable quantum computing is that elementary quantum gates can be implemented with sufficiently low error. One method for determining the error behavior of a gate implementation is to perform process tomography. However, standard process tomography is limited by errors in state preparation, measurement and one-qubit gates. It suffers from inefficient scaling with number of qubits and does not detect adverse error-compounding when gates are composed in long sequences. An additional problem is due to the fact that desirable error probabilities for scalable quantum computing are of the order of 0.0001 or lower. Experimentally proving such low errors is challenging. We describe a randomized benchmarking method that yields estimates of the computationally relevant errors without relying on accurate state preparation and measurement. Since it involves long sequences of randomly chosen gates, it also verifies that error behavior is stable when used in long computations. We implemented randomized benchmarking on trapped atomic ion qubits, establishing a one-qubit error probability per randomized pi/2 pulse of 0.00482(17) in a particular experiment. We expect this error probability to be readily improved with straightforward technical modifications.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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