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arXiv 0705.1638cond-mat.supr-con
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自旋涨落在Sm_{1.85} Ce_{0.15} CuO_4薄膜电阻率温度行为中的可能表现

Possible manifestation of spin fluctuations in the temperature behavior of resistivity in Sm_{1.85}Ce_{0.15}CuO_4 thin films

S. Sergeenkov, A. J. C. Lanfredi, F. M. Araujo-Moreira

摘要:

在$ρ(T)$周围的最佳掺杂的$Sm_{1.85}Ce_{0.15}CuO_4$薄膜中观察到电阻率$ρ(T)$的温度依赖性中的明显的台阶状(扭结)行为,并且归因于由具有能量$\hbar ω_{sf}=k_BT_{sf}\simeq 7meV$的$Sm^{3+}$矩引起的强自旋波动的表现。除了波动引起的贡献$ρ_{sf}(T)$由于热加宽效应(的宽度$ω_{sf}$),实验数据被发现是很好地拟合占剩余(零温度)$ρ_{res}$,电子-声子$ρ_{e-ph}(T)=AT$和电子-电子$ρ_{e-e}(T)=BT^2$的贡献。最佳拟合产生$ω_p=2.1meV$、$τ_0^{-1}=9.5\times 10^{-14}s^{-1}$、$λ=1.2$和$E_F=0.2eV$,分别用于估计等离子体频率、杂质散射率、电子-声子耦合常数和费米能量。

英文摘要:

A pronounced step-like (kink) behavior in the temperature dependence of resistivity $ρ(T)$ is observed in the optimally-doped $Sm_{1.85}Ce_{0.15}CuO_4$ thin films around $T_{sf}=87K$ and attributed to manifestation of strong spin fluctuations induced by $Sm^{3+}$ moments with the energy $\hbar ω_{sf}=k_BT_{sf}\simeq 7meV$. In addition to fluctuation induced contribution $ρ_{sf}(T)$ due to thermal broadening effects (of the width $ω_{sf}$), the experimental data are found to be well fitted accounting for residual (zero-temperature) $ρ_{res}$, electron-phonon $ρ_{e-ph}(T)=AT$ and electron-electron $ρ_{e-e}(T)=BT^2$ contributions. The best fits produced $ω_p=2.1meV$, $τ_0^{-1}=9.5\times 10^{-14}s^{-1}$, $λ=1.2$, and $E_F=0.2eV$ for estimates of the plasmon frequency, the impurity scattering rate, electron-phonon coupling constant, and the Fermi energy, respectively.

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